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Structural Contributions to Charge Transport across Ni-Octanedithiol Multilayer Junctions

Author(s):

Lam H. Yu, Christopher D. Zangmeister, James G. Kushmerick

Journal:

Nano Letters

Year:

2006

Volume:

6

Pages

2515–2519

DOI:

10.1021/nl061867j

Abstract:

We report the fabrication and characterization of multilayer thin films incorporating 1,8-octanedithiols and Ni atoms. Low-temperature charge transport measurements exhibit inelastic co-tunneling and resonant tunneling features that correspond energetically to vibrational excitations of the molecular multilayer. Several junctions exhibit changes in conductance features characteristic of charge defect-gating. Transport through our junctions is shown to be dominated by the intrinsic properties of the multilayer.

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