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Structural Contributions to Charge Transport across Ni-Octanedithiol Multilayer Junctions
Author(s):
Lam H. Yu, Christopher D. Zangmeister, James G. Kushmerick
Journal:
Nano Letters
Year:
2006
Volume:
6
Pages
2515–2519
DOI:
10.1021/nl061867j
Abstract:
We report the fabrication and characterization of multilayer thin films incorporating 1,8-octanedithiols and Ni atoms. Low-temperature charge transport measurements exhibit inelastic co-tunneling and resonant tunneling features that correspond energetically to vibrational excitations of the molecular multilayer. Several junctions exhibit changes in conductance features characteristic of charge defect-gating. Transport through our junctions is shown to be dominated by the intrinsic properties of the multilayer.
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